Volumes and Issues  Contents of Issue 3  
Atmos. Meas. Tech. Discuss., 3, 2477-2513, 2010
www.atmos-meas-tech-discuss.net/3/2477/2010/
doi:10.5194/amtd-3-2477-2010
© Author(s) 2010. This work is distributed
under the Creative Commons Attribution 3.0 License.


Quantitative sampling and analysis of trace elements in ambient air: impactor characterization and Synchrotron-XRF mass calibration

A. Richard, N. Bukowiecki, P. Lienemann, M. Furger, B. Weideli, M. Fierz, M. C. Minguillón, R. Figi, U. Flechsig, K. Appel, A. S. H. Prévôt, and U. Baltensperger

Abstract   Discussion Paper (PDF, 1019 KB)   Final Revised Paper (AMT)   
 
Interactive DiscussionStatus: Closed
AC: Author Comment | RC: Referee Comment | SC: Short Comment | EC: Editor Comment
Printer-friendly Version - Printer-friendly Version      Supplement - Supplement
 
RC C977: 'Referee notes to AMTD manuscript: Quantitative sampling and analysis of trace elements in ambient air etc. etc by Richard et al', Anonymous Referee #1, 20 Jul 2010 Printer-friendly Version 
SC C998: 'Reply to Referee #1', Agnes Richard, 22 Jul 2010 Printer-friendly Version 
 
RC C1006: 'Interactive comment on “Quantitative sampling and analysis of trace elements in ambient air: impactor characterization and Synchrotron-XRF mass calibration” by A. Richard et al.', Anonymous Referee #2, 23 Jul 2010 Printer-friendly Version 
AC C1323: 'Reply to Referee #2', Agnes Richard, 27 Aug 2010 Printer-friendly Version Supplement